XRD and FT-IR spectroscopy were used to trace crystallization course in the forma-tion of titanium silicalite molecular sieve, and its crystallization mechanism was discussed.

• 通过XRD和FT-IR等分析手段跟踪钛硅分子筛晶化生成分子筛的过程,并探讨了钛硅分子筛晶化生成分子筛的晶化机理。