In order to analyse PCM Parameter abnormalism and the reason of cirait lose efficacy directly and timely, We have developed the MOS C-V testing analysis function on the standard parameter test system cas the HP 4062 series).

• 为了及时、直接分析PCM参数异常及电路失效原因,我们在标准参数测试系统(如HP4062,Ag4070系列)上开发了MOSC-V测试分析功能。