As for application problems, the main failure reasons are damage caused by ESD and EOS, including mismatch in the output ports and incorrect biasing sequence, etc.

• 在使用不当方面，主要是静电放电(ESD)损伤和过电损伤(EOS)，EOS损伤中包括输出端失配、加电顺序等操作不当引入的过电应力等。