X-ray diffraction (XRD), scanning electron microscopy (SEM), atomic force microscopy (AFM) and reflection high energy diffraction (RHEED) were used to characterize the structures and the morphologies of the samples.

• 利用X射线衍射(XRD)、扫描电子显微术(SEM)、原子力显微术(AFM)、反射式高能电子衍射(RHEED)等手段测试,对样品结构和表面形貌进行表征。