The tests by X-ray diffraction (XRD) and atomic force microscopy (AFM) show that ETM is really assembled into the holes of PAA and some new phases are found besides the host materials.

• 通过对XRD衍射图的分析发现，ETM有序纳米阵列不仅有基质CaS的物相，还出现了新的物相，可能来源于氧化铝薄膜或组装过程中的污染。