The sub-aperture is detected and imaged using the X-Y scanning system.The information of full surface defects is obtained by stitching the sub-aperture images with the template matching principle.

• 对X,Y两方向进行子孔径图像扫描成像,利用模板匹配原理对获得的子孔径图像进行拼接得到全孔径表面疵病图像信息。