The study on the micro-infrared radiation of CMOS structures makes sense for the further understanding of various infrared radiation effects and improving the reliability of CMOS ICs.

• 对CMOS结构的显微红外发光现象产生机制进行了研究和实际观察，将对深入了解CMOS器件中各种红外发光效应和分析其可靠性具有实际意义。