The structure and photoelectrochemical properties of the films were investigated by using FE-SEM, XRD, Raman, DRS, IPCE(incident photon-to-current conversion efficiency) and photocurrent action curves.

• 采用FE-SEM、XRD、Raman、DRS、光电流响应谱、IPCE等手段；研究了Bi2WO6薄膜的形貌、结构、光电性能以及薄膜结构与光电性能的关系.