The other has two metal-insulator-semiconductor (MS) contacts with lower leakage current (less than 4 pA ,300V) and better energy resolution (about 10% FWHM for241Am 59.5KeV line) and poor working stability.

• 前者的漏电流较大，能量分辨率较差，但工作稳定性相对较好，后者的漏电流能降低到4pA(300V)以下，能量分辨率达到10%25(FWHM)左右，但工作稳定性较差；