The new algorithm is applied to find the target location of cell during the placement optimization, and it is combined with a heuristic local optimization approach to experiment on MCNC (Microelectronics Centre of North-Carolina) standard cell benchmarks.

• 针对集成电路标准单元模式的布局问题；提出了一个全新的基于改进等分节点法的启发式标准单元布局算法(TETP).；该算法在优化布局过程中采用改进的等分节点法寻找单元目标位置；同时结合局部寻优的启发式算法；对MCNC(MicroelectronicsCentreofNorth-Carolina)标准单元测试电路进行实验