The morphology, structure and composition of the electrodeposited films were investigated by ESEM, XPS, XRD, and EDS. And the Seebeck coefficients of Bi2-xSbxTe3 thermoelectric films electrodeposited at different potentials were measured.

• 通过ESEM、XPS、XRD、EDS等方法对电沉积薄膜的形貌、结构和组成进行了研究；并测试了在不同电位下制备的Bi2-xSbxTe3薄膜的温差电性能.