The experimental results show that for the circuits having many inputs,the length of test vectors generated by this method is much shorter and the hardware cost is smaller.

• 测试生成后，再将一维的测试向量转换成瞬态电流测试需要的测试向量对施加到被测电路。 实验表明，对于输入端较多的电路，该方法生成的测试向量序列长度极大的减少，硬件开销也较小。