The XPS spectra showed that CF2 structures are predominant in the films, and the FT-IR results showed that C-F absorption and teflon characteristic absorption are respensaible for the two strong peaks observed.

• FT-IR的结果表明，所得薄膜由C-F的最强吸收峰和聚四氟乙烯的特征吸收峰构成。 所得薄膜的这些结构特征与聚四氟乙烯的结构是一致的。