Scanning electron microscopy(SEM), transmission electron microscopy(TEM) and X-ray photoelectron spectroscopy (XPS) were used to evaluate the structure and composition.

• 利用扫描电子显微镜(SEM)、透射电子显微镜(TEM)和X射线光电子谱(XPS)对样品的形貌、结构及组份进行表征。