Owing to the above factors,The paper researchs the mixed-signal test based on test performance, alleviating the burden of ATE and the design for testability.

• 基于以上考虑,本文从如何有效提高测试性能、减轻对自动测试设备(ATE)的依赖和要求以及系统级芯片的可测性这一角度来研究模数混合信号系统芯片的测试。