Optical breakdown threshold, visible damage threshold,thermal melting threshold of semiconductor materials of the CCD device by anYAG Iaser and laser energy threshold caused the whole device to faiture are obtained.

• 得到了YAG激光致使组成电荷耦合器件的半导体材料的光学击穿阈值、视见损伤阈值、热熔融阈值和致使整个器件失效的激光功率阈值等有关结果。