On the basis of measuring the wettability of TiN, TiC films by Ag, Cu,Ni and Fe, their interfaces have been investigated with a Scanning Electron Microscope (SEM) and an Electron Probe Micro-Analyzer (EPMA).

• 本文在对 TiN、TiC陶瓷薄膜与金属 Ag、 Cu、 Ni、 Fe间的浸润性测量的基础上，用扫描电子显微镜（SEM）、电子探针（EPMA）对其界面进行了观察。