Meantime, the structure and properties of the films were investigated by XRD, FTIR, TG/DSC, SEM, etc. V2O5 thin films were successfully prepared on ITO substrate with cathode electrophoresis deposition (CED) through V2O5 sol.

• 利用XRD、TG/DSC、IR、Raman、NMR、SEM、交流阻抗谱、循环伏安法、分光光度计等测试方法,对(PANI)_xV_2O_5·nH_2O纳米复合薄膜体系的结构和性能进行分析。