It measures the change of Q-value of the Sapphire dielectric resonator after loading a HTS film,and the Rs of HTS film can be calculated by a simple equality :Q-1 =A +BRs .

• 它通过测量加载超导薄膜前后,介质谐振器的固有品质因数的变化,通过一个简便的等式Q-1=A+BRs 来确定超导薄膜的微波表面电阻Rs。