By using the popular 2-D semiconductor device simulator, device termination structure with FLR is simulated and analysed, especially the influence of surface charges on breakdown voltage and optimal spacing of ring to ring .

• 最后用流行的2-D半导体器件模拟工具MEDICI对器件终端进行相关模拟；尤其是表面电荷对带场限环的击穿电压和优化环间距的影响做了大量的分析模拟.