By using Differential Interference Contrast (DIC) microscopy,the particle size distribution of the coarse and fine particle was observed,similar to that of Andersen Model 240 dual channel mass sampler.

• 利用具有无限远光学系统的微分干涉相衬显微技术对该系统所采集到的颗粒物进行了显微观察,得到粗颗粒和细颗粒的粒径分布,与Andersen公司240型双通道采样器的切割性能十分接近。