According to experimental results, the mechanism of leakage current instability is given as due to an increase in Z+n density at the grain surface. Consequently, the Schottky barrier at the ZnO grain surface is decreased and the leakage current increased.

• 根据实验结果；提出漏电流不稳定性的机理是锌离子在晶粒表面积累；降低了氧化锌表面肖特基势垒的高度；使漏电流上升.